Description
- SEM - Scanning electron microscopy: JEOL model 4200 SEM with 5-axis stage, can accommodate specimens up to 25 mm x 25 mm x 6 mm.
- EDS - Energy dispersive x-ray spectroscopy: Oxford EDS system for performing chemical analyses.
- EBSD - Electron backscattered electron diffraction: Oxford system for detecting crystallographic orientation and deformation.
- Laser Confocal Scanning Microscope - Keyence VK9700 microscope system for no-contact analysis of topographical features to 10 nm resolution and angles up to 80 degrees from horizontal over large areas (8 cm x 8 cm).
- Stylus Profilometer - measurement of surface roughness and topographical features by contact method over areas up to 1 cm x 1 cm.
- FTIR - Fourier transform Infrared spectroscopy(with ATR) : apparatus for identifying the chemical species by bonding energies.
- DSC - Differential scanning calorimeter: apparatus for analyzing thermodynamics and kinetics of phase reactions in materials .
- TGA - Thermogravimetric analysis : apparatus for analyzing chemical reactions due to mass changes and release of gaseous by-products.
- Mechanical Property Testing Facility - Equipment is available for tensile testing according to ASTM E-8 for up to 30 cm length and 1 cm 2 cross-section. Wire pieces and composite samples can also be accommodated. Hardness measurements of centimeter-scale samples, and portable hardness measurement of large pieces. Bend and impact testing to 10 mm thickness.