Available Technology

Sensor enhancement through algorithmic acquisition using synchronization with a scan generator

Abstract: 

A system and method for image enhancement associated with scan generators is provided. For example, a source stimulates a device under test (DUT) at electrical interconnects. An internal clock of the DUT is synchronized with the scan rate of the source to reduce the noise of the output signal and enhance a resultant image. A phase adjustment is effected to further reduce the noise in the signal. The synchronization and the phase adjustment seek to ensure that the data is collected at uniform times relative to the reference signal and thereby reduce the noise introduced into the system, by such offsets. Post-scan processing increases the signal-to-noise ratio through averaging techniques. Using a pixel overlay algorithm the averaged data is transformed into a 2-D array and the image of the DUT reconstructed.

Inventors: 

D. Martin; A. Duncan; F. Barsun

Patent Number: 
9417286
Technology Type(s): 
Engineering
Internal Laboratory Ref #: 
102532
Patent Status: 
Active
Patent Issue Date: 
August 16, 2016
Region
Midwest
State: 
Indiana
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