Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over...
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This invention disclosure details a process for filling trenches and vias with gold so that they can be used for interconnects in microelectronics. The process fills the features preferentially from t...
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A novel smart target has been designed for vison agnostic systems to acquire six-dimensional (6-D) information of a moving object (x, y, z, pitch, yaw, and roll) with high accuracy. The smart target i...
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Presently, there are no commercial tools for x-ray absorption and emission spectroscopy with picosecond time resolution. Additionally, there are no table-top tools for x-ray emission spectroscopy with...
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We have demonstrated an easy-to-manufacture 25-mm-long ultra-stable optical reference cavity geared toward transportable photonic microwave generation systems and mobile optical atomic clock applicati...
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DEPARTMENT OF DEFENSE
Department of the Army
Notice of Intent to Grant Exclusive Patent License to Ferson Technologies, LLC; Ocean Springs, MS
AGENCY: Department of the Army, DoD.
ACTION: Notice of ...
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This new invention leverages Pixel Probe technology but vastly improves its usability. One can think of the new invention as a measuring machine that scans a Pixel Probe over an object to measure its ...
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In electron microscopy, no commercial system exists to accomplish transmission of high-fidelity, low-loss broadband microwave frequency signals from an external source to a spatially confined transmis...
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Legionella pneumophila is an opportunistic pathogen in premise plumbing systems (OPPPs) that is responsible for Legionnaires' Disease, which is a form of pneumonia with a 10% mortality rate. Acco...
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