Advanced UV and X-ray Probes

Agency/Department

FLC Region

Security Lab

No

Address

Brookhaven National Laboratory P.O. Box 5000, Bldg. 735
Upton

Laboratory Representative

(P)

(631) 344-3645

Description

The CFN operates three end-stations at the National Synchrotron Light Source ( NSLS) for nanomaterials characterization. The station located at the X9 beamline performs simultaneous small- and wide-angle X-ray scattering experiments for nano-scale structural characterization of a variety of materials. The Ambient Pressure X-ray Photoelectron Spectroscopy (AP-XPS) station located at beamline X1A1 is capable of soft X-ray photoelectron spectroscopy for quantitative surface chemical analysis of a range of materials at gas pressures up to about 1 Torr. The undulator beamline U5UA hosts a station operating in ultra-high vacuum with a low-energy electron microscope (LEEM) and X-ray photo-emission electron microscope (XPEEM). The LEEM-XPEEM system can be used to study static and dynamic properties of surfaces and thin films, including growth, phase transitions, reactions, surface electronic structure and morphology.

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