Microstructural Analysis Lab

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Description

The Microstructural Analysis Lab specializes in failure analysis, material testing specimen analysis, alloy and ceramic material development.

Asset List:

  • JEOL JSM 6460LV Scanning Electron Microscope (SEM)
    1. Provides high magnification images of material surfaces
    2. Used extensively for failure analyses
    3. Integrated with energy and wavelength dispersive X-ray spectrometers (EDS/WDS) for compositional analysis of samples
  • JEOL JSM 5800LV Scanning Electron Microscope
  • Oxford Energy and Wavelength Dispersive X-ray Spectrometers
  • Panalytic X-ray Diffractometer
  • JEOL JEM 2100 Transmission Electron Microscope (TEM)
    1. Provides extremely high magnification images of the internal structure of materials.
    2. Used in the analysis of newly developed metal alloys
    3. Integrated with an EDS for compositional analysis
  • Nikon Epiphot Metallurgical Microscopes
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