High Speed On-Wafer Characterization Laboratory

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Description

At the High Speed On-Wafer Characterization Laboratory, researchers characterize and model devices operating at terahertz (THz) and millimeter-wave frequencies. The facility is unique in its ability to perform nonlinear device characterization, including state-of-the-art load pull and arbitrary digital waveform synthesis, making this the only laboratory DoD-wide where actual mil waveforms are tested directly on-wafer. Additionally, the capability to test at high power while controlling temperature enables the design of high power linear sources and expands the range of performance at the integrated circuit (chip) level.

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