Available Technology

DIGITALLY-CONFIGURABLE SUSCEPTOMETER BASED ON SEMICONDUCTING AND MAGNETOELECTRONIC EFFECTS

A Digitally-Configurable Susceptometer has been developed for magnetic susceptibility measurements of thin semiconducting and ferromagnetic films. The instrument consists of a sample chamber contained inside a solenoid for generating alternating magnetic fields. There is also an embedded heater cartridge within the sample chamber. Eight electrodes protrude downward from the chamber roof to form electrical junctions between a thin film and external current and voltage sources and meters, respectively. Digital circuitry reconfigures active junctions to toggle between in-line and Hall voltage measurements. Used together with an electromagnet and a lock-in amplifier, the instrument permits complex measurements of the steady-state (dc) voltage response (U) of a thin film to an applied magnetic field (B) and the differential voltage response (change in U) to the solenoid excitation field (change in B) at a frequency f.
Inventors: 
Daniel Gopman
Patent Number: 
9,714,991
Internal Laboratory Ref #: 
14-032
Phone: 
301-975-2573
Email: 
tpo@nist.gov
Lab Representatives
Share to Facebook Share to Twitter Share to Google Plus Share to Linkedin