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United States Patent | 6,198,097 |
Abbate , et al. | March 6, 2001 |
An apparatus and/or system is described which uses the photocharge voltage concept in lieu of optical scattering techniques to measure surface topology and properties of materials. The system is based on the measurement of a small electrical potential difference which appears on any solid body when subjected to illumination by a modulated laser light. This voltage is proportional to the induced change in the surface electrical charge and is capacitively measured on various materials. The characterization of coatings to be used inside the base of guns is just one possible application for use by the U. S. Army.
Inventors: | Abbate; Agostino (Clifton Park, NY), Frankel; Julius (Rensselaer, NY), Das; Pankaj K. (Latham, NY) |
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Assignee: |
The United States of America as represented by the Secretary of the Army
(Washington,
DC)
|
Family ID: | 22038503 |
Appl. No.: | 09/061,843 |
Filed: | April 15, 1998 |
Current U.S. Class: | 850/3; 850/18; 977/868 |
Current CPC Class: | G01N 21/1717 (20130101); Y10S 977/868 (20130101) |
Current International Class: | G01N 21/17 (20060101); G01N 023/227 () |
Field of Search: | ;250/306 |
5105305 | April 1992 | Betzig et al. |
5393980 | February 1995 | Yost et al. |
5464977 | November 1995 | Nakagiri et al. |
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