Address
Building 653, Room 406 2977 P Street
Wright-Patterson AFB
Want more information? Contact a representative below.
(P)
937-255-5669
Description
The purpose is to provide morphological
characterization of materials. Primary capabilities are: X-ray
diffraction characterization of single and polycrystalline
materials at ambient, cooled or elevated temperatures; optical
microscopic characterization at room and elevated temperatures;
X-ray scattering of polymer fibers and film (with or without
applied tension); electron microscopic characterization of
surfaces.