Available Technology

Digital Test System

Abstract: 

A highly flexible, compact, lightweight, and portable testing system for use with radiation testing activities. The testing system is coupled to a device under test (DUT), which can be positioned in such a way that the top of the die package is exposed to the direct ion beam during radiation testing. A variety of sensors, onboard memory systems, programmable interfaces, onboard control systems, data output devices, and different types of interfaces are also provided which provide an ability to perform testing procedures while having a maximum ability to orient the DUT and perform a wide variety of testing currently unavailable.

Inventors: 

M. Gadlage; A. Duncan

Patent Number: 
10107858
Technology Type(s): 
Engineering
Internal Laboratory Ref #: 
200360
Patent Status: 
Active
Patent Issue Date: 
October 23, 2018
Region
Midwest
State: 
Indiana
Lab Representatives
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