Available Technology

Atomic force microscope with combined FTIR-Raman spectroscopy having a micro thermal analyzer

An atomic force microscope is provided that includes a micro thermal analyzer with a tip. The micro thermal analyzer is configured for obtaining topographical data from a sample. A raman spectrometer is included and is configured for use in obtaining chemical data from the sample.

Samuel D. Fink, Fernando F. Fondeur

Patent Number: 
Patent Issue Date: 
November 18, 2011
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